## Abstract Amorphous silicon carbide (aβSiC) films, deposited by plasmaβenhanced chemical vapor deposition (PECVD), have been evaluated as insulating coatings for implantable microelectrodes. The aβSiC was deposited on platinum or iridium wire for measurement of electrical leakage through the coat
β¦ LIBER β¦
Deposition of silicon-based dielectrics by remote plasma-enhanced chemical vapor deposition
β Scribed by G. Lucovsky; D.V. Tsu
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 958 KB
- Volume
- 86
- Category
- Article
- ISSN
- 0022-0248
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