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Deposition cycle of atomic layer deposition HfO2 film: Effects on electrical performance and reliability

โœ Scribed by Cheng, Yi-Lung; Hsieh, Cheng-Yang; Chang, You-Ling


Book ID
122568119
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
657 KB
Volume
528
Category
Article
ISSN
0040-6090

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