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Dependence of transient enhanced diffusion on defect depth position in ion implanted silicon

โœ Scribed by S. Solmi; F. Cembali; R. Fabbri; R. Lotti; M. Servidori; M. Anderle; R. Canteri


Book ID
113279679
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
336 KB
Volume
37-38
Category
Article
ISSN
0168-583X

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