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Atomistic analysis of defect evolution and transient enhanced diffusion in silicon

โœ Scribed by Aboy, Maria; Pelaz, Lourdes; Marques, Luis A.; Enriquez, L.; Barbolla, Juan


Book ID
115517705
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
332 KB
Volume
94
Category
Article
ISSN
0021-8979

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