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Modeling of the Ostwald ripening of extrinsic defects and transient enhanced diffusion in silicon

โœ Scribed by A Claverie; B Colombeau; F Cristiano; A Altibelli; C Bonafos


Book ID
114165199
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
123 KB
Volume
186
Category
Article
ISSN
0168-583X

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