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Dependence of Polarity and Crystal Quality of the HVPE GaN Buffer Layers on the Surface Treatment of Substrates (GaAs and Sapphire)

โœ Scribed by T. Sato; M. Namerikawa; M. Suzuki; R. Souda; F. Hasegawa


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
208 KB
Volume
0
Category
Article
ISSN
1862-6351

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