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The Influence of Buffer Layer Growth Parameters on the Microstructure and Surface Morphology of GaN on Sapphire Substrates Correlated with in-situ Reflectivity

✍ Scribed by Wood, D.A. ;Parbrook, P.J. ;Lynch, R.J. ;Lada, M. ;Cullis, A.G.


Publisher
John Wiley and Sons
Year
2001
Tongue
English
Weight
327 KB
Volume
188
Category
Article
ISSN
0031-8965

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