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Dependence of electron channel mobility on Si-SiO/sub 2/ interface microroughness

✍ Scribed by T. Ohmi; K. Kotani; A. Teramoto; M. Miyashita

Book ID: 126676559
Publisher: IEEE
Year: 1991
Tongue: English
Weight: 251 KB
Volume: 12
Category: Article
ISSN: 0741-3106
DOI: 10.1109/55.116944

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