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The influence of mobile ions on the Si/SiO2 interface traps

✍ Scribed by M.W. Hillen; D.G. Hemmes

Publisher: Elsevier Science
Year: 1981
Tongue: English
Weight: 757 KB
Volume: 24
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(81)90059-9

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