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Degradation of tunnel-thin silicon dioxide films

✍ Scribed by Grekhov, I.V.; Shulekin, A.F.; Vexler, M.I.

Book ID: 114537094
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 55 KB
Volume: 44
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.644661

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