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Evolution of stress in evaporated silicon dioxide thin films

✍ Scribed by Ming Fang, 方明; Dafei Hu, 胡达飞; Jianda Shao, 邵建达


Book ID
115368479
Publisher
Optics InfoBase
Year
2010
Tongue
English
Weight
714 KB
Volume
8
Category
Article
ISSN
1671-7694

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