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Surface plasmons and breakdown in thin silicon dioxide films on silicon

โœ Scribed by Kim, Jong-Hyun; Sanchez, Julian J.; DeMassa, Thomas A.; Quddus, Mohammed T.; Smith, David; Shaapur, Farhad; Weiss, Karl; Liu, Chuan H.


Book ID
121189464
Publisher
American Institute of Physics
Year
1998
Tongue
English
Weight
484 KB
Volume
84
Category
Article
ISSN
0021-8979

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