✦ LIBER ✦

Dielectric Breakdown in Silicon Dioxide Films on Silicon

✍ Scribed by Osburn, C. M.; Ormond, D. W.

Book ID: 121720565
Publisher: The Electrochemical Society
Year: 1972
Tongue: English
Weight: 858 KB
Volume: 119
Category: Article
ISSN: 0013-4651
DOI: 10.1149/1.2404268

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Electrical Conduction and Dielectric Bre

Electrical Conduction and Dielectric Breakdown in Silicon Dioxide Films on Silicon

✍ Osburn, C. M.; Weitzman, E. J. 📂 Article 📅 1972 🏛 The Electrochemical Society 🌐 English ⚖ 789 KB

Surface plasmons and breakdown in thin s

Surface plasmons and breakdown in thin silicon dioxide films on silicon

✍ Kim, Jong-Hyun; Sanchez, Julian J.; DeMassa, Thomas A.; Quddus, Mohammed T.; Smi 📂 Article 📅 1998 🏛 American Institute of Physics 🌐 English ⚖ 484 KB

Breakdown voltage enhancement for device

Breakdown voltage enhancement for devices on thin silicon layer/silicon dioxide film

✍ Nakagawa, A.; Yasuhara, N.; Baba, Y. 📂 Article 📅 1991 🏛 IEEE 🌐 English ⚖ 468 KB

Temperature accelerated dielectric break

Temperature accelerated dielectric breakdown of PECVD low-kcarbon doped silicon dioxide dielectric thin films

✍ H. Zhou; F.G. Shi; B. Zhao; J. Yota 📂 Article 📅 2005 🏛 Springer 🌐 English ⚖ 488 KB

Dielectric properties of fluorinated sil

Dielectric properties of fluorinated silicon dioxide films

✍ S Hasegawa; T Tsukaoka; T Inokuma; Y Kurata 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 313 KB

Ellipsometric studies of silicon dioxide

Ellipsometric studies of silicon dioxide films on silicon

✍ S. Yaghmour; W.E.J. Neal 📂 Article 📅 1985 🏛 Elsevier Science ⚖ 404 KB