Breakdown voltage enhancement for devices on thin silicon layer/silicon dioxide film

✍ Scribed by Nakagawa, A.; Yasuhara, N.; Baba, Y.

• Book ID: 114538240
• Publisher: IEEE
• Year: 1991
• Tongue: English
• Weight: 468 KB
• Volume: 38
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.85162