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Degradation of AlGaN/GaN high electron mobility transistors related to hot electrons

✍ Scribed by Meneghini, Matteo; Stocco, Antonio; Silvestri, Riccardo; Meneghesso, Gaudenzio; Zanoni, Enrico

Book ID: 120822514
Publisher: American Institute of Physics
Year: 2012
Tongue: English
Weight: 644 KB
Volume: 100
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.4723848

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