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Degradation dynamics and breakdown of MgO gate oxides

✍ Scribed by E. Miranda; E. O’Connor; G. Hughes; P. Casey; K. Cherkaoui; S. Monaghan; R. Long; D. O’Connell; P.K. Hurley

Book ID
104052298
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
419 KB
Volume
86
Category
Article
ISSN
0167-9317

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