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Defects caused by high-energy ion beams, as measured by scanning probe methods

✍ Scribed by L.P Biró; J Gyulai; G.I Márk; Cs.S Daróczi

Book ID
104369179
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
930 KB
Volume
30
Category
Article
ISSN
0968-4328

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