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Depth Profile of Titanium Alloy (Ti-6Al-4V) and Residual Stress Measured by Using X-Ray Diffraction after Metal Cutting Assisted by High-Pressured Jet Cooling Evaluation of Etching Methods: ION Beam (EDOS) and Electro-Chemical Etching

✍ Scribed by Vosough, Manoucheh; Liu, Ping; Svenningsson, Inge


Book ID
121716004
Publisher
Trans Tech Publications, Ltd.
Year
2005
Tongue
English
Weight
223 KB
Volume
490-491
Category
Article
ISSN
1662-9752

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