Application of X-ray methods for the investigation of structural effects caused by high-energy argon ions bombardment in silicon crystal

✍ Scribed by Prof. Dr. J. Auleytner; Z. Furmanik; J. Gorecka

• Publisher: John Wiley and Sons
• Year: 1987
• Tongue: English
• Weight: 242 KB
• Volume: 22
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.2170220428