On the possibility of application of x-ray diffraction edge contrast for the quantitative determination of high-energy heavy ion range in silicon

✍ Scribed by Prof. Dr. J. Auleytner; J. Bak-Misiuk; Z. Furmanik; J. Morawiec

• Publisher: John Wiley and Sons
• Year: 1988
• Tongue: English
• Weight: 350 KB
• Volume: 23
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.2170230124