✦ LIBER ✦
Coarse-grained analysis of crystalline defects caused by ion beam irradiation: The PM (pixel mapping) method
✍ Scribed by S. T. Nakagawa
- Book ID
- 102824044
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 710 KB
- Volume
- 177
- Category
- Article
- ISSN
- 0424-7760
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