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Defects annealing in 4H–SiC epitaxial layer probed by low temperature photoluminescence

✍ Scribed by Litrico, G.; Zimbone, M.; Musumeci, P.; Calcagno, L.

Book ID: 119330776
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 265 KB
Volume: 15
Category: Article
ISSN: 1369-8001
DOI: 10.1016/j.mssp.2012.07.002

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