✦ LIBER ✦

Deep-depletion-layer impact-ionization-induced gate-oxide breakdown in thin-oxide n-MOSFETs

✍ Scribed by M.Q. Huang; P.T. Lai; Z.J. Ma; H. Wong; Y.C. Cheng

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Deep-depletion-layer impact-ionization-i

📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 111 KB

A study on hot-carrier-induced gate oxid

✍ Hongxia Liu; Yue Hao; Jiangang Zhu 📂 Article 📅 2002 🏛 SP Science Press 🌐 English ⚖ 400 KB

Carrier lifetime analysis in thin gate o

✍ K. Hayama; K. Takakura; H. Ohyama; J. M. Rafí; A. Mercha; E. Simoen; C. Claeys 📂 Article 📅 2007 🏛 Springer US 🌐 English ⚖ 452 KB

Radiation source dependence of performan

✍ K. Hayama; K. Takakura; H. Ohyama; S. Kuboyama; S. Matsuda; J.M. Rafí; A. Mercha 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 400 KB