A study on hot-carrier-induced gate oxide breakdown in partially depleted SIMOX MOSFET’s

✍ Scribed by Hongxia Liu; Yue Hao; Jiangang Zhu

• Book ID: 107502328
• Publisher: SP Science Press
• Year: 2002
• Tongue: English
• Weight: 400 KB
• Volume: 19
• Category: Article
• ISSN: 0217-9822
• DOI: 10.1007/s11767-002-0008-0