✦ LIBER ✦
Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs
✍ Scribed by J.M. Rafí; E. Simoen; K. Hayama; A. Mercha; F. Campabadal; H. Ohyama; C. Claeys
- Book ID
- 108210641
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 517 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0026-2714
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