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Correlation of DC and AC electrical properties of Al/p-Si structure by I–V–T and C(G/ω)–V–T measurements

✍ Scribed by Orhan Özdemir; Beyhan Tatar; Deneb Yılmazer; Pınar Gökdemir; Kubilay Kutlu

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 905 KB
Volume: 12
Category: Article
ISSN: 1369-8001
DOI: 10.1016/j.mssp.2009.09.005

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