Structural and electrical properties of ZnSe laser diodes optimized by transmission electron microscopy, reflection high energy electron diffraction, X-ray diffraction and C-V profiling

✍ Scribed by T. Behr; D. Hommel; H. Cerva; J. Nürnberger; V. Beyersdorfer; G. Landwehr

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 596 KB
• Volume: 150
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(95)80039-f