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Copper impurity levels in silicon: Naotake Tayama Solid-st. Electron. 26 (1), 37 (1983)

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 102 KB
Volume: 16
Category: Article
ISSN: 0026-2692
DOI: 10.1016/s0026-2692(85)80091-4

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