Determination of the oxygen precipitate-free zone width in silicon wafers from surface photovoltage measurements : Terry I. Chappell, Patrick W. Chye and Morton A. Tavel. Solid-St. Electron.26 (1), 33 (1983)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 135 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91124-1