Thermal emission rates and capture cross-section of majority carriers at titanium levels in silicon : J. R. Morante, J. E. Carceller, P. Cartujo and J. Barbolla. Solid-St. Electron.26 (1), 1 (1983)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 135 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91130-7