Defect levels in chromium-doped silicon : Takemitsu Kunio, Jr., Tatsuya Yamazaki, Eiji Ohta and Makoto Sakata. Solid-St. Electron.26 (2), 155 (1983)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 259 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91131-9