Control of Al-doping in 4H-SiC homo-epit
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Sartel, C. ;Soulière, V. ;Zielinski, M. ;Monteil, Y. ;Camassel, J. ;Smith, L. ;R
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Article
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2005
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John Wiley and Sons
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English
⚖ 225 KB
## Abstract We report on the growth of thin, aluminium doped, homo‐epitaxial layers of 4H–SiC using a threefold mixture of purified hexamethyldisilane (HMDS) admixted with propane (P) and trimethylaluminium (TMA). The growth has been performed in an AP‐CVD, cold wall, vertical reactor in which the