Conference on industrial application of X-ray analysis
- Publisher
- Elsevier Science
- Year
- 1958
- Weight
- 462 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0371-1951
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๐ SIMILAR VOLUMES
In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reรectivity and angle-dependent x-ray รuorescence measurements are combin
X-ray microรuorescence provides the analytical scientist with a powerful tool to solve a variety of materials-based problems. Spatially resolved non-destructive elemental analyses can rapidly address a number of problems using qualitative analysis. Point spectra, line proรles and elemental maps o โ e
## Abstract Smallโangle Xโray scattering (SAXS) was applied for the structural analysis of an industrial polymer dispersion in water (synthetic latex). For the preparation of the spherical latex particles under investigation, butadiene, styrene, and acrylic acid were used as monomers in a seeded em