𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Annual conference on applications of X-ray analysis

Publisher
Elsevier Science
Year
1970
Weight
19 KB
Volume
5
Category
Article
ISSN
0025-5416

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πŸ“œ SIMILAR VOLUMES

Applications of Glancing Incidence X-Ray
Applications of Glancing Incidence X-Ray Analysis
✍ A. J. G. Leenaers; D. K. G. de Boer πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 481 KB πŸ‘ 1 views

In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reΓ‘ectivity and angle-dependent x-ray Γ‘uorescence measurements are combin

Applications of x-ray microfluorescence
Applications of x-ray microfluorescence to materials analysis
✍ George J. Havrilla πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 760 KB

X-ray microΓ‘uorescence provides the analytical scientist with a powerful tool to solve a variety of materials-based problems. Spatially resolved non-destructive elemental analyses can rapidly address a number of problems using qualitative analysis. Point spectra, line proÐles and elemental maps o †e