X-ray microΓuorescence provides the analytical scientist with a powerful tool to solve a variety of materials-based problems. Spatially resolved non-destructive elemental analyses can rapidly address a number of problems using qualitative analysis. Point spectra, line proΓles and elemental maps o β e
β¦ LIBER β¦
Application of coincidence techniques to X-ray fluorescence analysis
β Scribed by P. Puumalainen; P. Sikanen
- Publisher
- Elsevier Science
- Year
- 1983
- Weight
- 255 KB
- Volume
- 212
- Category
- Article
- ISSN
- 0167-5087
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