In the x-ray microรuorescence analysis of particles, the characteristic line intensity depends not only on the chemical composition of the sample, but also on the x-ray beam proรle, particle size, shape and orientation. In previous work, optical measurements of particle dimensions were required to d
Applications of x-ray microfluorescence to materials analysis
โ Scribed by George J. Havrilla
- Publisher
- John Wiley and Sons
- Year
- 1997
- Tongue
- English
- Weight
- 760 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0049-8246
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โฆ Synopsis
X-ray microรuorescence provides the analytical scientist with a powerful tool to solve a variety of materials-based problems. Spatially resolved non-destructive elemental analyses can rapidly address a number of problems using qualitative analysis. Point spectra, line proรles and elemental maps o โ er di โ erent approaches for characterization information on a wide variety of materials. Applications are presented which span customer service complaints to experimental ceramic materials to fossils.
๐ SIMILAR VOLUMES
In this paper, we used back-foil scanning X-ray microfluorescence (SXRF) and we examined the sensitivity of the technique for the analysis of very thin overlayers, where electron probe X-ray microanalysis (EPMA) reaches its detection limits. The lateral resolution of back-foil SXRF is also calculate
In many technological applications layered materials have an increasing importance. Almost complete characterization of such materials can be achieved with glancing incidence x-ray analysis (GIXA). Within this technique, x-ray reรectivity and angle-dependent x-ray รuorescence measurements are combin