๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Application of the channeling and X-ray diffraction techniques for defect analysis

โœ Scribed by R. Kaufmann; G. Linker; O. Meyer

Publisher
Elsevier Science
Year
1983
Weight
404 KB
Volume
218
Category
Article
ISSN
0167-5087

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Design of an X-Ray Powder Diffraction Pr
Design of an X-Ray Powder Diffraction Probe for Multi-Channel Application: Proof of Principle
โœ M. J. G. Fait; M. Schneider; J. Tilgner; A. Bjeoumikhov; D. Linke; U. Rodemerck ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 406 KB ๐Ÿ‘ 1 views

The design of an X-ray powder diffraction probe and its integration with a multichannel reactor system for potential application in high-throughput experimentation is presented. The working principle of the apparatus is exemplified by measurements of corundum and of the phase change observed when ox

Analysis of broadened X-ray diffraction
Analysis of broadened X-ray diffraction profiles: Application to the characterization of carbon steels
โœ N. Ji; J.L. Lebrun; J.M. Sprauel ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 544 KB

On the basis of the principle of Warren-Averbach X-ray diffraction profile analysis, an accurate and rapid method of broadened X-ray diffraction profile analysis characterized by the use of a Voigtlike function for profile fitting and by a new modellization of the real part of the Fourier coefficien