Analysis of broadened X-ray diffraction profiles: Application to the characterization of carbon steels
โ Scribed by N. Ji; J.L. Lebrun; J.M. Sprauel
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 544 KB
- Volume
- 127
- Category
- Article
- ISSN
- 0921-5093
No coin nor oath required. For personal study only.
โฆ Synopsis
On the basis of the principle of Warren-Averbach X-ray diffraction profile analysis, an accurate and rapid method of broadened X-ray diffraction profile analysis characterized by the use of a Voigtlike function for profile fitting and by a new modellization of the real part of the Fourier coefficients has been developed. The purpose of this study is to link the mechanical macroscopic properties (hardness, ultimate tensile strength, coM work) of the studied materials with profile analysis parameters, such as the integral peak width, the average coherent domain size and the distortion factor, and also to study the influence of external loading on plastic deformation of materials. Two applications have been realized: firstly a low alloyed carbon steel (0.35%C-1%Cr) quenched and tempered at various temperatures was studied, and secondly a nickel-alloyed steel (9% Ni) deformed by traction (0.36%-10%) or by torsion (5%-150%) has been analysed.
๐ SIMILAR VOLUMES
It is suggested that graphitization consists of the decomposition of an intercalation compound, C,H, and the out diffusion of hydrogen.
Ah&act-Various applications of X-ray photoelectron spectroscopy (XPS) for carbon fiber are described. Car~ni~tion process on surface of fiber is tracked by XPS as variation of elemen~i composi~n and also of chemical species revealed by chemical shift in XPS spectra as shown in Pig. 2. Surface oxida