๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Composition and thickness determination of thin oxide films: comparison of different programs and methods

โœ Scribed by Sammelselg, V.; Aarik, J.; Aidla, A.; Kasikov, A.; Heikinheimo, E.; Peussa, M.; Niinist, L.

Book ID
119943037
Publisher
Royal Society of Chemistry
Year
1999
Tongue
English
Weight
123 KB
Volume
14
Category
Article
ISSN
0267-9477

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Quantitative analysis of overlapping XPS
Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: determination of the thickness and composition of thin iron oxide films
โœ Graat, Peter; Somers, Marcel A. J. ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 333 KB ๐Ÿ‘ 2 views

The composition and thickness of thin iron oxide รlms on polycrystalline pure iron were evaluated from Fe 2p spectra as measured by x-ray photoelectron spectroscopy. To this end the experimental spectra were reconstructed from reference spectra of the constituents Fe0, Fe2' and Fe3'. The background