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Determination of thin film refractive index and thickness by means of film phase thickness

✍ Scribed by Nenkov, Milen ;Pencheva, Tamara

Book ID
111488935
Publisher
Walter de Gruyter GmbH
Year
2008
Tongue
English
Weight
675 KB
Volume
6
Category
Article
ISSN
2391-5471

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Determination of the refractive index and the thickness of thin-films using light interference have been presented. This has been done, for the first time, with the use of LloydΓ•s interferometer. The mean idea is based on using the sample in two different positions in the same interferometer. The me