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Determination of thickness, refractive index, and thickness irregularity for semiconductor thin films from transmission spectra

✍ Scribed by Aqili, Akram K. S. ;Maqsood, Asghari

Book ID
115349724
Publisher
The Optical Society
Year
2002
Tongue
English
Weight
184 KB
Volume
41
Category
Article
ISSN
1559-128X

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Determination of the refractive index and the thickness of thin-films using light interference have been presented. This has been done, for the first time, with the use of LloydΓ•s interferometer. The mean idea is based on using the sample in two different positions in the same interferometer. The me