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New method for determining refractive index and thickness of fluorescent thin films

✍ Scribed by W. Lukosz; R.E. Kunz


Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
365 KB
Volume
31
Category
Article
ISSN
0030-4018

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Total internal reflection (TIR) and attenuated total reflection (ATR) measurements in the Kretschmann configuration have been performed at 25 8C with poly(methyl methacrylate) (PMMA) films (of ca. 2.5 lm thickness) spincoated on top of a 50 nm thick gold layer, as a function of the applied hydrostat