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A new method for determining the thickness and composition of thin layers by electron probe microanalysis

✍ Scribed by Dr. Ing. H.-J. Hunger; Dipl.-Phys. W. Baumann; Dipl.-Phys. S. Schulze


Publisher
John Wiley and Sons
Year
1985
Tongue
English
Weight
345 KB
Volume
20
Category
Article
ISSN
0232-1300

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