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Application of the Pontriaguin Method to a Simple Model for Electron Probe Microanalysis

✍ Scribed by M. Villafuerte; S. Heluani; H. Brizuela; C. Hoffmann


Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
183 KB
Volume
26
Category
Article
ISSN
0049-8246

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✦ Synopsis


An analytical expression for the characteristic line intensity of the x-rays emitted by a probe when bombarded by an electron beam is obtained using the Pontriaguin method. This method is applied to a simple model which is brieΓ‘y described.


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