Application of the Pontriaguin Method to a Simple Model for Electron Probe Microanalysis
β Scribed by M. Villafuerte; S. Heluani; H. Brizuela; C. Hoffmann
- Publisher
- John Wiley and Sons
- Year
- 1997
- Tongue
- English
- Weight
- 183 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0049-8246
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β¦ Synopsis
An analytical expression for the characteristic line intensity of the x-rays emitted by a probe when bombarded by an electron beam is obtained using the Pontriaguin method. This method is applied to a simple model which is brieΓy described.
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