The composition and thickness of thin iron oxide Γlms on polycrystalline pure iron were evaluated from Fe 2p spectra as measured by x-ray photoelectron spectroscopy. To this end the experimental spectra were reconstructed from reference spectra of the constituents Fe0, Fe2' and Fe3'. The background
β¦ LIBER β¦
Simultaneous determination of composition and thickness of thin iron-oxide films from XPS Fe 2p spectra
β Scribed by Peter C.J. Graat; Marcel A.J. Somers
- Book ID
- 103619264
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 399 KB
- Volume
- 100-101
- Category
- Article
- ISSN
- 0169-4332
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Thin oxide Γlms play an important role in the corrosion of metals. Using XPS it is possible in principle to obtain information on the chemical state of near-surface atoms, the stoichiometry of the surface layer and its thickness. A problem is the quantiΓcation of XPS spectra, due to the large uncert