Simultaneous determination of composition and thickness of thin films by x-ray microanalysis at 300 kV and Monte Carlo simulation

✍ Scribed by A. Armigliato; R. Rosa

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 764 KB
• Volume: 32
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/0304-3991(90)90031-g