✦ LIBER ✦

Comparison of rotational depth profiling with AES and XPS

✍ Scribed by A. Zalar; S. Hofmann

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Determination of concentration depth-pro

✍ S.E. Borodyansky; Yu.G. Abashkin 📂 Article 📅 1991 🏛 Elsevier Science ⚖ 75 KB

Depth profiling through quantitative ana

✍ Arne L. Tofterup 📂 Article 📅 1991 🏛 Elsevier Science ⚖ 76 KB

XPS and SIMS depth profiling of oxynitri

✍ L. Vanzetti; M. Bersani; M. Sbetti; M. Anderle 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 79 KB

Depth profiling of microelectronic struc

✍ M Maier 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 374 KB

AES Depth Profiling of Nitrogen Implante

✍ Dr. Josef Zemek; Ing. Le Van Phac; Ing. Jaroslav Král 📂 Article 📅 1986 🏛 John Wiley and Sons 🌐 English ⚖ 379 KB

High-temperature oxidation of (Ti,Pd)N a

✍ E Huber; S Hofmann 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 303 KB