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High-temperature oxidation of (Ti,Pd)N and (Cr,Pd)N coatings studied with AES and XPS sputter depth profiling

✍ Scribed by E Huber; S Hofmann


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
303 KB
Volume
45
Category
Article
ISSN
0042-207X

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