๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Comparison of quasicrystalline (T2) and crystalline (R) structures in AlCuLi using high-resolution X-ray diffraction

โœ Scribed by Poon, S. J.; Dmowski, W.; Egami, T.; Shen, Y.; Shiflet, G. J.


Book ID
111947765
Publisher
Taylor and Francis Group
Year
1987
Tongue
English
Weight
359 KB
Volume
56
Category
Article
ISSN
0950-0839

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Strain and relaxation in Si-MBE structur
โœ G. V. Hansson; H. H. Radamsson; Wei-Xin Ni ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Springer US ๐ŸŒ English โš– 655 KB

High resolution X-ray diffraction measurements have been done on Si(001)-based structures grown by molecular beam epitaxy (MBE). By systematically varying the angle of incidence and the diffraction angle, the diffraction intensity data can be displayed in a two-dimensional X-ray diffraction intensit