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Strain and defect structure of iron implanted In0.53Ga0.47As using high-resolution X-ray diffraction

✍ Scribed by P. Too; J.Z. Domagala; J. Bak-Misiuk; A. Kozanecki; S. Ahmed; B.J. Sealy

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 148 KB
Volume: 239
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2005.04.123

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